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README cleanup

This commit is contained in:
Andreas Olofsson 2015-11-17 17:34:41 -05:00
parent 144e683c2b
commit bac3d5f887

View File

@ -2,7 +2,7 @@
ELINK INTRODUCTION
=====================================
The "elink" is a low-latency/high-speed interface for communicating between FPGAs and ASICs (such as EpiphanyIII). The interface can achieve a peak throughput of 8 Gbit/s (duplex) in modern FPGAs using 24 LVDS signal pairs.
The "elink" is a low-latency/high-speed interface for communicating between FPGAs and ASICs (such as EpiphanyIII). The interface can achieve up to 8 Gbit/s (duplex) in fast speed grade FPGAs using 24 LVDS signal pairs.
###HOW TO SIMULATE
You can simulate the elink using the open source ICARUS verilog simulator. Proprietary Verilog simulators should also work.(although we haven't tried them)
@ -15,12 +15,14 @@ $ ./run.sh test/test_hello.memh
$ gtkwave waveform.vcd #to view results
```
###TEST FORMAT
###WRITING TESTS
The elink simulator reads in a test file with the format seen below:
```
<srcaddr>_<data>_<dstaddr>_<ctrlmode><datamode><wr/rd>_<delay>
```
There are a number of pre written tests in the elink/dv/tests directory.
Example: (tests/test_hello.memh)
```sh
AAAAAAAA_11111111_80800000_05_0010 //32 bit write
@ -34,8 +36,9 @@ AAAAAAAA_55555555_80800010_05_0010 //
810D000c_DEADBEEF_8080000c_04_0010 //
810D0010_DEADBEEF_80800010_04_0010 //
```
###RANDOM TEST GENERATOR
To elink comes with a test transaction generator with random sequences of different data format and burst lenghts. To run a randomly generated test.
Directed testing will only get you so far so we created a simple random transaction generator that produces sequences of different data format and burst lenghts. To generate a random testfile and simulate:.
```sh
$ cd oh/elink/dv